Damage Constitutive Model and Failure Mechanism of Lead-Free Solder in CBGA Package

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Abstract:

A viscoplastic constitutive model with void damage is developed to analyze the macroscopic mechanical response and damage mechanism of lead-free solder alloy in CBGA packaging under cyclic thermal loading. The constitutive model is implemented into ABAQUS through its user defined material subroutine. Two-dimensional nonlinear finite element analysis of a ceramic ball grid array(CBGA) package is conducted to simulate the viscoplastic deformation and damage failure process of the lead-free solder joint under cyclic thermal loading. The damage model is helpful for optimization and reliability of electronic package.

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Periodical:

Advanced Materials Research (Volumes 44-46)

Pages:

77-84

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Online since:

June 2008

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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