p.51
p.57
p.65
p.71
p.77
p.85
p.91
p.97
p.105
Damage Constitutive Model and Failure Mechanism of Lead-Free Solder in CBGA Package
Abstract:
A viscoplastic constitutive model with void damage is developed to analyze the macroscopic mechanical response and damage mechanism of lead-free solder alloy in CBGA packaging under cyclic thermal loading. The constitutive model is implemented into ABAQUS through its user defined material subroutine. Two-dimensional nonlinear finite element analysis of a ceramic ball grid array(CBGA) package is conducted to simulate the viscoplastic deformation and damage failure process of the lead-free solder joint under cyclic thermal loading. The damage model is helpful for optimization and reliability of electronic package.
Info:
Periodical:
Pages:
77-84
Citation:
Online since:
June 2008
Authors:
Price:
Сopyright:
© 2008 Trans Tech Publications Ltd. All Rights Reserved
Share:
Citation: