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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 443-444Effect of the Y2O3 Addition Content on the...

Effect of the Y₂O₃Addition Content on the Structural Properties of ZrO₂Thin Films and Coating Material

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Abstract:

The influence of addition of Y₂O₃ on the structure of ZrO₂ thin films and bulk material was studied employing X-ray diffraction (XRD) analysis. The films were prepared by the electron-beam evaporation method. XRD analysis permits the study of the stabilization process. For pure ZrO₂ thin film and coating material, the crystallographic structure is monoclinic phase; with increasing Y₂O₃ mole percent, the structure of Y₂O₃ stabilized ZrO₂ (YSZ) material changes from a mixture of monoclinic and cubic phase to a single cubic phase. Furthermore, calculated results of grain size show that YSZ thin film and coating material have the same crystallization trend.

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Periodical:

Advanced Materials Research (Volumes 443-444)

Pages:

655-659

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.443-444.655

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Online since:

January 2012

Authors:

Shi Gang Wu, Hong Ying Zhang, Jian Da Shao, Zheng Xiu Fan

Keywords:

Phase Transition, Structure, X-Ray Diffraction (XRD), YSZ

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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