Effect of the Y2O3 Addition Content on the Structural Properties of ZrO2 Thin Films and Coating Material

Abstract:

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The influence of addition of Y2O3 on the structure of ZrO2 thin films and bulk material was studied employing X-ray diffraction (XRD) analysis. The films were prepared by the electron-beam evaporation method. XRD analysis permits the study of the stabilization process. For pure ZrO2 thin film and coating material, the crystallographic structure is monoclinic phase; with increasing Y2O3 mole percent, the structure of Y2O3 stabilized ZrO2 (YSZ) material changes from a mixture of monoclinic and cubic phase to a single cubic phase. Furthermore, calculated results of grain size show that YSZ thin film and coating material have the same crystallization trend.

Info:

Periodical:

Advanced Materials Research (Volumes 443-444)

Edited by:

Li Jian

Pages:

655-659

DOI:

10.4028/www.scientific.net/AMR.443-444.655

Citation:

S. G. Wu et al., "Effect of the Y2O3 Addition Content on the Structural Properties of ZrO2 Thin Films and Coating Material", Advanced Materials Research, Vols. 443-444, pp. 655-659, 2012

Online since:

January 2012

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$35.00

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