Research on ODC Based Software Defect Analysis Model

Qian Ran Si; Guo Ying Yan; Hui Ying Zhang

doi:10.4028/www.scientific.net/AMR.457-458.488

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 457-458Research on ODC Based Software Defect Analysis...

Research on ODC Based Software Defect Analysis Model

Abstract:

In this paper we discuss the fundamental principle of defect analysis, introduce the basic framework of Orthogonal Defect Classification（ODC）, and summarize the principle and features of defect analysis based on ODC. Using software defect metric, defect baseline and inference rules to do software process analysis, we propose a novel defect analysis model based on ODC. Combined with practical projects, the principle of this model is discussed in details, and this model can improve the objectivity and effectiveness of defect analysis, which is favorable for the automated defect analysis.

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Periodical:

Advanced Materials Research (Volumes 457-458)

Pages:

488-494

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.457-458.488

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Online since:

January 2012

Authors:

Qian Ran Si, Guo Ying Yan, Hui Ying Zhang

Keywords:

Defect Analysis, Orthogonal Defect Classification, Software Defects

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