Electromagnetic Analysis of Apodized Annular-Aperture Logarithmic Axicons in Wave Imaging Systems

Yan Zhong Yu; Wen Bin Dou

doi:10.4028/www.scientific.net/AMR.459.95

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 459Electromagnetic Analysis of Apodized...

Electromagnetic Analysis of Apodized Annular-Aperture Logarithmic Axicons in Wave Imaging Systems

Abstract:

An apodized annular-aperture logarithmic axicon (3ALA) can be applied potentially to improve imaging resolution in quasi-optical and/or millimeter wave imaging systems, due to its property of long depth of field (DOF). Electromagnetic analyses of forward and backward 3ALAs are conducted respectively at mm- and submm-wavebands. Their lateral and axial intensity distributions are evaluated by rigorous electromagnetic analysis method. And the comparative conclusions are drawn at last in our present work

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Periodical:

Advanced Materials Research (Volume 459)

Pages:

95-98

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.459.95

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Online since:

January 2012

Authors:

Yan Zhong Yu, Wen Bin Dou

Keywords:

3ALA, Axial Intensity, Lateral Intensity, mm/submm Wavelengths

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