Wavelet Face Recognition Using Bayesian Classifier

Article Preview

Abstract:

A novel wavelet face recognition using Bayesian classifier technique is presented. Wavelet-based and 2DLDA method have to down sample the original image dataset. In the preprocessing stage, the system uses 2DLDA to select the N top-ranked candidate images but forges making the final choice among those candidates, secondly all the candidate images are decomposed by applying wavelet transform, Bayesian recognition is parallel processed using these sub-band images. Final decision is made by use of weighed average. Our experiments on FERET have shown the effectiveness of the method.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

561-564

Citation:

Online since:

February 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] M. Turk, A. Pentland, Eigenfaces for Recognition, J. Cognitive Neurosci, 1991, 3 (1): pp.71-86.

Google Scholar

[2] P.N. Belhumeur, J.P. Hespanha, and D.J. Kriegman, Eigenfaces vs. Fisherfaces: Recognition Using Class Specific Linear Projection, IEEE Trans. On Pattern Analysis and Machine Intelligence, vol. 19, no. 7, pp.711-720, (1997).

DOI: 10.1109/34.598228

Google Scholar

[3] WANG Xiao gang , TANG Xiao ou. Bayesian face recognition based on Gaussian mixture models[C] /Proc of the 17th International Conference on Pattern Recognition. 2004: 142-145.

DOI: 10.1109/icpr.2004.1333724

Google Scholar

[4] WANG Xiao gang, TANG Xiao ou. Bayesian face recognition using Gabor features[C] /Proc of ACM SIGMM Workshop on Biometrics Methods and Applications. 2003: 70-73.

DOI: 10.1145/982507.982521

Google Scholar

[5] B. Moghaddam, T. Jebara, and A. Pentland, Bayesian Face Recognition, Pattern Recognition, Vol. 33, pp.1771-1782, (2000).

DOI: 10.1016/s0031-3203(99)00179-x

Google Scholar

[6] Yang Jian, et al. Two-dimensional PCA: A New Approach to Appearance-based Face Representation and Recognition[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2004, 26(1): 131-137.

DOI: 10.1109/tpami.2004.1261097

Google Scholar