Experimental Study for Cement Microscopic Property by Backscatter Scanning Technique

Tao Ye; Bin Jiang; Xian Xian Ye

doi:10.4028/www.scientific.net/AMR.476-478.1581

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 476-478Experimental Study for Cement Microscopic Property...

Experimental Study for Cement Microscopic Property by Backscatter Scanning Technique

Abstract:

As the technology develops, digital image processing technology has become a necessarily new method for studying particle property and particle analysis. This method helps researchers to gain deeper understanding of microstructure and powder particle property. In the paper work, the characteristics of different ingredients of cement microscopic property are analyzed with the technology of SEM backscattered electron image. Based on experimental analysis, microstructure and all kinds of cement characteristic parameters are analyzed quantificationally. It is seen that this method in the paper effectively and comprehensively computers the microscopic characteristics parameter of powder.

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Periodical:

Advanced Materials Research (Volumes 476-478)

Pages:

1581-1584

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.476-478.1581

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Online since:

February 2012

Authors:

Tao Ye, Bin Jiang, Xian Xian Ye

Keywords:

Backscatter Scanning, Cement, Microscopic Property

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