[1]
Yoshio Yamamoto,Hiroshi Eda,Jun Shimizu.Proceeding of the 1999 IEEE/SME.International Conference on Advanced Intelligent Mechatronics:215-220.
Google Scholar
[2]
Chunlin Xia,Fan Ding,Guoliang Tao.Chinese Journal of Mechanical Engineering,Vol. 10(1999), pp.563-565.(In Chinese)
Google Scholar
[3]
Zhenyuan Jia,Xing Yang,Dongming Guo,etc.Journal of Mechanical Engineering,Vol.37(2001), pp.46-49.(In Chinese)
Google Scholar
[4]
Jun Xu,Yijie Wu,Zhangrong Zhao,etc.Control and Test.(2007), pp.47-49.(in Chinese)
Google Scholar
[5]
Quanguo Lu,Dingfang Chen,Yuning Zhong,etc.Chinese Journal of Mechanical Engineering, Vol. 18(2007), pp.16-19.(In Chinese)
Google Scholar
[6]
Min Chen, Quanguo Lu, Dehui Liu, etc. Journal of Nanchang Institute Technology, Vol. 26(2007), pp.27-30. (In Chinese)
Google Scholar
[7]
Chuhui Liu.Control and Test. (2006), pp.50-52.(In Chinese)
Google Scholar
[8]
Bing Zhao,Yijie Wu,Zhangrong Zhao,etc.Design and Research. (2008), pp.12-14.(In Chinese)
Google Scholar
[9]
Xianpeng Nie.Dissertation of Jilin University. (2008).(In Chinese)
Google Scholar
[10]
Jie Xu.Dissertation of Zhejiang University. (2006).(In Chinese)
Google Scholar
[11]
Information of DS18B20 on http://www.datasheet.com.
Google Scholar
[12]
Information of STC12c5410AD on http://www.datasheet.com.
Google Scholar
[13]
Information of IRF540 on http://www.datasheet.com.
Google Scholar
[14]
Information of IRF9540 on http://www.datasheet.com.
Google Scholar
[15]
Information of TLP250 on http://www.datasheet.com.
Google Scholar