Study on Fault Diagnosis in Analog Circuit

Li Jia Xu; Zhi Liang Kang

doi:10.4028/www.scientific.net/AMR.490-495.628

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 490-495Study on Fault Diagnosis in Analog Circuit

Study on Fault Diagnosis in Analog Circuit

Abstract:

Hidden Markov model (HMM) for the diagnosis of incipient faults in analog circuits is presented. Firstly, output voltage signals under faulty conditions are obtained with simulation. Subsequently, output voltages corresponding to the test frequencies are extracted from the response of analog circuits. Finally, the output voltage vectors are used to form the observation sequences, which are sent to training HMM to accomplish the diagnosis of the incipient faults. The performance of the proposed method is tested, and it indicates that the method is effective and has better recognition capability than the popularly used back-propagation (BP) network.

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Periodical:

Advanced Materials Research (Volumes 490-495)

Pages:

628-632

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.490-495.628

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Online since:

March 2012

Authors:

Li Jia Xu, Zhi Liang Kang

Keywords:

Fault Diagnosis, Hidden Markov Model (HMM), Incipient Fault, Simulation

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