Application of SVM Classifier and Fractal Feature in Circuit Fault Diagnosis

Jing Kui Mao; Xian Bai Mao

doi:10.4028/www.scientific.net/AMR.490-495.942

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 490-495Application of SVM Classifier and Fractal Feature...

Application of SVM Classifier and Fractal Feature in Circuit Fault Diagnosis

Abstract:

Combining SVM and fractal theory, a novel fault diagnosis method for analog circuits based on SVM using fractal dimension is developed in this paper. Simulation results of diagnosing the Sallen-Key band pass filter circuit have confirmed that the proposed approach increases the fault diagnosis accuracy, thereby it may be considered as an alternative for the analog fault diagnosis.

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Periodical:

Advanced Materials Research (Volumes 490-495)

Pages:

942-945

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.490-495.942

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Online since:

March 2012

Authors:

Jing Kui Mao, Xian Bai Mao

Keywords:

Feature Extraction, Fractal Gridding Dimension, Support Vector Machine (SVM)

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