Wetting and Intermetallic Study between Sn-3.5Ag-1.0Cu-xZn Lead-Free Solders and Copper Substrate (x = 0, 0.1, 0.4, 0.7)

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The development of lead-free solders has been an essential task in the electronics industry because of the restriction of lead use by legislation. Among the candidates, Sn-Ag-Cu group of solder alloys have great advantages to replace the conventional Sn-Pb solder. In this study, the wetting and intermetallic study between Sn-3.5Ag-1.0Cu-xZn lead-free solder reacting on copper substrate were investigated under different soldering conditions. The addition of 0.7wt% of Zn improved the wettability on Cu substrate since it has the highest spreading area at 310°C. The Cu6Sn5 and Cu3Sn phases are the main interface intermetallic formed and these intermetallics increased in thickness with time and temperature. At 270°C, the addition of 0.7wt% Zn retarded the growth of Cu3Sn intermetallic until 10 min of the soldering time. Generally the addition of Zn was beneficial in retarding the total intermetallic thickness.

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150-154

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April 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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