AFM Interaction Forces of Lubricity Materials Surface

Article Preview

Abstract:

Micro interaction forces of lubricity surface of silicon and mica were studied using atomic force microscopy (AFM). From different scanning angle and bisection distance of the AFM, a new method of measuring micro static friction of lubricity surface materials was investigated. Results show that the micro coefficients of static and sliding friction of mica are less than the silicon, but the adhesive force is bigger. The mechanism of friction force of the two lubricity materials was discussed.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

95-98

Citation:

Online since:

June 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] S.H. Kim, D.B. Asay, M.T. Dugger, Nanotribology and MEMS, Nano today 2 (2007) 22-29.

DOI: 10.1016/s1748-0132(07)70140-8

Google Scholar

[2] B. Bhushan, J.N. Israelachvili, U. Landman, Nanotribology: friction, wear and lubrication at the atomic scale, Nature 374 (2002) 607-616.

DOI: 10.1038/374607a0

Google Scholar

[5] F. Lewis, P. Horny, P. Hale, S. Turgeon, M. Tatoulian, D. Mantovani, Study of the adhesion of thin plasma fluorocarbon coatings resisting plastic deformation for stent applications, J. Phys. D: Appl. Phys. 41 (2008) 045310.

DOI: 10.1088/0022-3727/41/4/045310

Google Scholar

[6] Q. Jun, L. Jianbin, W. Kunlin W. Shizhu, Mechanical and tribological properties of diamond-Like carbon films deposited by electron cyclotron resonance microwave plasma chemical vapor deposition, Tribol. Lett. 14 (2003) 105-109.

DOI: 10.1023/a:1021704320444

Google Scholar

[7] Z. Guo, Y. Meng, C. Su, H. Wu, An on-chip micro-friction tester for tribology research of silicon based MEMS devices, Microsyst. Technol. 14 (2007) 109-118.

DOI: 10.1007/s00542-007-0413-2

Google Scholar

[8] J. Krim, Surface science and the atomic-scale origins of friction: what once was old is new again, Surf. Sci. 500 (2002) 741–758.

DOI: 10.1016/s0039-6028(01)01529-1

Google Scholar

[9] S. Sriram, M. Bhaskaran, K.T. Short, G.I. Matthews, A.S. Holland, Thin film piezoelectric response characterisation using atomic force microscopy with standard contact mode imaging, Micron 40 (2009) 109-113.

DOI: 10.1016/j.micron.2008.01.007

Google Scholar

[10] X. Li, W. Guan, H. Yan, Fabrication and AFM/FFM studies of polyacrylamide-carbon nanotubes (PAM-CNTs) copolymer thin films, Mater Chem Phys. 88 (2004) 53-58.

DOI: 10.1016/j.matchemphys.2004.05.048

Google Scholar