Characterization of Indium-Doped CdZnTe Crystal Grown under Te-Rich Conditions

Article Preview

Abstract:

CdZnTe (CZT) crystals with a diameter of 52 mm was grown using low pressure Bridgman method and were indium-doped under Te-rich conditions. Results showed the Te concentration was almost the same in different part of the as-grown ingot. Through IR transmission, Te inclusion with regular triangular or circular shapes could be observed, and the size of Te inclusion was around 7 µm and the concentration was 1.5  105 cm-3 for the CZT in the middle part of the ingot. I-V characteristic showed a good linear behavior with a resistivity of ~1010 Ω•cm.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 535-537)

Pages:

1446-1449

Citation:

Online since:

June 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] R.B. James, T.E. Schlesinger, J. Lund: Semicond. Semimetals. Vol. 43 (1995), p.335

Google Scholar

[2] Y. Eisen, A. Shor, I. Mardor: Nucl. Instr. Meth. Phys. Res. Vol. 428 (1999), p.158

Google Scholar

[3] C.B. Hruska, M.K. O'Connor, Phys. Med. Vol. 21 (2006), p.72

Google Scholar

[4] M.Fiederle, C.Eiche, M.Salk: Appl Phys. Vol. 84 (1998), pp.6689-6692

Google Scholar

[5] Tao Wang, Jie Wanqi: Trans. Nonferrous Met. Soc. China. Vol. 19 (2009), pp.622-625.

Google Scholar

[6] A.E. Bolotnikov, G.S. Camarda, G.A. Carini, Y. Cui, K.T. Kohman, L. Li, M.B. Salomon, R.B. James: IEEE Trans. Nucl. Sci. Vol. 54 (2007), p.821.

DOI: 10.1109/tns.2007.894555

Google Scholar