Fabric Defect Classification Based on Local Binary Patterns and Tamura Method

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Abstract:

This paper aims at investigating methods for solving the problem of automated fabric defect classification which kind of defect has been occurred. Texture features for classification using local binary patterns and Tamura Method. These features are classified using the conjugate gradient BP network. Fabric samples are used in the evaluation and the experimental results obtained further confirm the designed algorithm achieved a high detection success rate.

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Periodical:

Advanced Materials Research (Volumes 562-564)

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1720-1723

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Online since:

August 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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[1] Xuezhi Yang, Grantham Pang, Nelson Yung. Discriminative training approaches to fabric defect classification based on wavelet transform. Pattern Recognition. 37(5) (2004) p, 889–899.

DOI: 10.1016/j.patcog.2003.10.011

Google Scholar

[2] Vittorio Murino, Manuele Bicego, Ivan A. Rossi. Statistical classification of raw textile defects Pattern Recognition. ICPR Proceedings of the 17th International Conference. 4 (2004) p, 311 – 314.

DOI: 10.1109/icpr.2004.1333765

Google Scholar

[3] Ebraheem Shady, Yasser Gowayed, Mohamed Abouiiana. Detection and classification of defects in knitted fabric structures. Textile Research Journal. 76 (4) (2006) p, 295-300.

DOI: 10.1177/0040517506053906

Google Scholar

[4] Tamura Hideyuki, Mori Shunji, Yamawaki Takashi. Textural features corresponding to visual perception. IEEE Transactions on Systems, Man and Cybernetics. 8(6) (1978) p, 460 – 473.

DOI: 10.1109/tsmc.1978.4309999

Google Scholar

[5] Timo Ojala, Matti PietikaÈ inen, Topi MaÈenpaÈa. Multiresolution gray-scale and rotation invariant texture classification with local binary patterns. IEEE Transactions on Pattern Analysis and Machine Intelligence. 24(7) (2002) p, 971-987.

DOI: 10.1109/tpami.2002.1017623

Google Scholar