[1]
M. Pecht. Prognostics and Health Management of Electronics, Wiley-Interscience, New York, (2008).
Google Scholar
[2]
N. Vichare, M. Pecht. Prognostics and Health Management of Electronics. IEEE Transactions on Components and Packaging Technologies, VOL. 29(1), pp: 222-229, (2006).
DOI: 10.1109/tcapt.2006.870387
Google Scholar
[3]
J. Gu, N. Vichare, T. Tracy, and M. Pecht. Prognostics Implementation Methods for Electronics. Reliability and Maintainability Symposium, pp.101-106. Orlando, FL, (2007).
DOI: 10.1109/rams.2007.328050
Google Scholar
[4]
S. Mathew, D. Das, R. Rosenberger, and M. Pecht. Failure Mechanism Based Prognostics. Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, (2008).
DOI: 10.1109/phm.2008.4711438
Google Scholar
[5]
Rubyca Jaai and Michael Pecht. A prognostics and health management roadmap for information and electronics-rich systems, Microelectronics Reliability, Volume 50, Issue 3, Pages 317-323, (2010).
DOI: 10.1016/j.microrel.2010.01.006
Google Scholar
[6]
Sachin Kumar, Vasilis Sotiris, and Michael Pecht. Health Assessment of Electronic Products using Mahalanobis Distance and Projection Pursuit Analysis, International Journal of Computer, Information, and Systems Science, and Engineering, vol. 2 Issue. 4 , pp.242-250, (2008).
DOI: 10.1109/aero.2008.4526608
Google Scholar
[7]
P. Sandborn and M. Pecht. Introduction to Special Section on Electronic Systems Prognostics and Health Management, Microelectronics Reliability, Vol. 47, No. 12, pp.1847-1848, (2007).
DOI: 10.1016/j.microrel.2007.03.004
Google Scholar
[8]
P. A. Sandborn and C. Wilkinson. A Maintenance Planning and Business Case Development Model for the Application of Prognostics and Health Management (PHM) to Electronic Systems, Microelectronics Reliability, , Vol. 47, No. 12, pp.1889-1901, (2007).
DOI: 10.1016/j.microrel.2007.02.016
Google Scholar
[9]
Michael Pecht and Jie Gu. Physics-of-failure based Prognostics for Electronic Products. Transactions of the Institute of Measurement and Control 31, 3/4, pp.309-322, (2009).
DOI: 10.1177/0142331208092031
Google Scholar
[10]
Sony Mathew, Diganta Das, Roger Rossenberger, and Michael Pecht. Failure Mechanisms Based Prognostics. 2008 International Conference on Prognostics and Health Management.
DOI: 10.1109/phm.2008.4711438
Google Scholar
[11]
Sony Mathew, Mohammed Alam, Michael. Identification of Failure Mechanisms to Enhance Prognostic Outcomes. Journal of Failure Analysis and Prevention. Vol. 12(1): 66-73, (2012).
DOI: 10.1007/s11668-011-9508-2
Google Scholar
[12]
Gebraeel Nagi, Lawley Mark, LI Rong, and Ryan Jennifer. Residual Life Distributions from Component Degradation Signals: A Bayesian Approach (2005). Research Collection Lee Kong Chian School of Business (Open Access). Paper 473, (2005).
DOI: 10.1080/07408170590929018
Google Scholar
[13]
Shunfeng Cheng, Michael Pecht. A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products. 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, (2009).
DOI: 10.1109/coase.2009.5234098
Google Scholar