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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 602-604Determination of Coated Substrate Roughness by...

Determination of Coated Substrate Roughness by Quantification of Measured Depth Profiles

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Abstract:

The glow discharge optical emission spectroscopy (GDOES) depth profiles of zinc-coated copper substrates polished by different mesh size sandpapers are well fitted with the mixing-roughness-information (MRI) model. Based on the MRI fits, the copper substrate roughness parameters and the coating layer thickness values are extracted. Using the so-called 84% to 16% method, the depth resolution values of the measured GDOES depth profiles are obtained, thereby the respective roughness parameters are determined. The obtained zinc-coated copper substrate roughness values are correlated with the experimental measurements.

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Periodical:

Advanced Materials Research (Volumes 602-604)

Pages:

1624-1629

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.602-604.1624

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Online since:

December 2012

Authors:

Xiao Yin Wang, Wei Jian, Yi Liu, Shao Ping Rao, Xing Xing Zhu, Yi Shan Han, Jiang Yong Wang

Keywords:

Depth Resolution, GDOES Depth Profiling, Mri Model, Surface/Interface Roughness

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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