Development of a Reliability Course for Emerging Circuits and Systems

Chi Un Lei; K.L. Man; Eng Gee Lim; Nan Zhang; Kai Yu Wan

doi:10.4028/www.scientific.net/AMR.622-623.1922

Paper Titles

Subsidized Energy Pricing in Bangladesh and Consequences of Phasing Subsidy Out
p.1896

Analysis and Comparison of Pollution Flashover Performance of Porcelain Insulators in Distribution System 22 kV
p.1901

Parallelizing GF (p) Montgomery Elliptic Curve Crypto-System Operations to Improve Security and Performance
p.1906

The Research of Ship’s Electric Fields Characteristic wih Different Number of Compensatory Anode
p.1912

Three-Phase Induction Motor Modeling and Control Based on the EL Equation
p.1917

Development of a Reliability Course for Emerging Circuits and Systems
p.1922

The Implementing of Customer Management System in E-Commerce
p.1925

Analysis and Application of Class and Interface in C# Language
p.1929

Empirical Tests of Scale-Free Characteristic in Open Source Software: A Replicated Case Study
p.1933

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 622-623Development of a Reliability Course for Emerging...

Development of a Reliability Course for Emerging Circuits and Systems

Abstract:

This paper presents a curriculum design of a course about reliability of circuits and systems. Contents in the learning modules include failure mechanisms of electronics, reliability for electronic components and circuit systems and simulation for circuit reliability. Through learning modules, students can learn concepts about reliability in circuits and systems, as well as develop awareness to design a reliable circuit system.

You might also be interested in these eBooks

Manufacturing Science and Technology III

View Preview

Info:

Periodical:

Advanced Materials Research (Volumes 622-623)

Pages:

1922-1924

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.622-623.1922

Citation:

Cite this paper

Online since:

December 2012

Authors:

Chi Un Lei, K.L. Man, Eng Gee Lim, Nan Zhang, Kai Yu Wan

Keywords:

Circuit, Circuit Reliability, Electrical Engineering Education, System

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] C.U. Lei, H. K. Kwan, Y. Liu, N.Wong, Efficient Linear Macromodeling Via Least-Squares Response Approximation, in Proc. IEEE ISCAS, May 2008, pp.2993-2996.

DOI: 10.1109/iscas.2008.4542087

Google Scholar

[2] C.U. Lei, N. Wong, WISE: Warped Impulse Structure Estimation for Time Domain Linear Macromodeling, IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 2, No. 1, pp.131-139, Jan 2012.

DOI: 10.1109/tcpmt.2011.2170983

Google Scholar

[3] M. Stanisavljevi, M. Schmid, Y. Leblebici, Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures, first ed., Springer, 2010.

Google Scholar

[4] C.U. Lei, H. K.H. So, E. Y. Lam, K. K.Y. Wong, R. Y.K. Kowk, C. K.Y. Chan, Teaching Introductory Electrical Engineering: a Project-Based Learning Experience, in Proc. IEEE TALE, 5 pages, submitted.

DOI: 10.1109/tale.2012.6360320

Google Scholar

[5] C.U. Lei, Applying the Problem–Based Learning Approach in Teaching Digital Integrated Circuit Design, in Proc. ELEHEIC 2010, Dec. 2010.

Google Scholar

[6] C.U. Lei, T. Krilavicius, N. Zhang, K. Wan, K.L. Man, Using Web 2.0 Tools to Enhance Learning in Higher Education: A Case Study in Technological Courses, in Proc. IAENG IMECS, pp.1153-1156, Mar. 2012.

Google Scholar