Paper Titles

Data Imputation for Regional Traffic Index Based on GSO-NN
p.587

A New Local and Global Model to Iris Recognition
p.592

An Efficient Iris Segmentation Method for Non-Ideal Iris Images
p.597

Mixed H_∞/H₂ Output Feedback Stability Control for Dual-Motor Independent Drive Electric Vehicle
p.602

High Sensitivity Refractive Index Sensor Based on Long Period Fiber Gratings in Line Mach-Zehnder Interferometer
p.609

Development of a Hybrid Life Cycle Cost Model for Estimating Product Design Alternatives in Cloud Computing Based Collaborative Design Environment
p.614

Amplifier Design on 16-Channel High-Frequency Current Drive
p.620

Design of Automatic Detection System for Temperature Sensor Based on LabVIEW
p.626

Design of a Multi-Mode Asymmetric Waveform Generator for FAIMS
p.631

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 658High Sensitivity Refractive Index Sensor Based on...

High Sensitivity Refractive Index Sensor Based on Long Period Fiber Gratings in Line Mach-Zehnder Interferometer

Article Preview

Abstract:

Mach-Zehnder interferometer formed by a pair of long period fiber gratings on single mode fiber is investigated as surrounding refractive index sensors. Interference fringes with bandwidth of 1.68 nm are induced by core mode and the excited cladding mode. High SRI sensitivity of 280.74 nm/RIU at 1437.74 nm in the range of 1.333 to 1.360 is achieved. Whilst the strain sensitivity (~0.33 nm/mε) and temperature response (~20.7 pm/°C) at 1428.64 nm are relatively low, which is superior in avoiding cross sensitivity in refractive index measurement.

You might also be interested in these eBooks

Materials and Manufacturing Research

Info:

Periodical:

Advanced Materials Research (Volume 658)

Pages:

609-613

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.658.609

Citation:

Cite this paper

Online since:

January 2013

Authors:

Jia Rong Zheng, Yong Qin Yu, Zhi Long Ou, Chen Lin Du, Pei Guang Yan, Ji Shun Wang

Keywords:

Long Period Fiber Gratings, Mach-Zehnder Interferometer, Surrounding Refractive Index

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Low D K Y, Xie H, Xiong Z and Lim G C: Appl. Phys. A Vol. 81(2005), p.1633.

[2] Martinez, A. , Dubov, M. , Khrushchev, I. and Bennion, I. : Electronics Letters , Vol. 40 (2004), pp.1170-1172.

[3] Y. Wang, M. Yang, D. Wang, S. Liu, and P. Lu: J. Opt. Soc. Am. B Vol. 27 (2010), pp.370-374.

[4] Y. Kondo, K. Nouchi, and T. Mitsuyu, M. Watanabe, P. G. Kazansky and K. Hirao: Opt. Lett. Vol. 24 (1999), pp.646-648.

DOI: 10.1364/ol.24.000646

[5] B. Li, L. Jiang, S. Wang, H. Tsai and H. Xiao: Opt. Laser Technol. Vol. 43 (2011), pp.1420-1423.

[6] A. M. Vengsarkar, P. J. Lemaire, J. B. Judkins, V. Bhatia, T. Erdogan, and J. E. Sipe: J. Lightwave Technol. Vol. 14 (1996), pp.58-65.

DOI: 10.1109/50.476137

[7] P. F. Wysocki, J. B. Judkins, R. P. Espindola, M. Andrejco and A. M. Vengsarkar: IEEE PHOTONIC TECH L, Vol. 9 (1997), pp.1343-1345.

[8] V. Bhatia and A. M. Vengsarkar: Opt. Lett. Vol. 21(1997), pp.692-694.

[9] R. Falate, O. Frazão, G. Rego, J. L. Fabris and J. L. Santos: Appl. Opt. Vol. 45 (2006), pp.5066-5072.

DOI: 10.1364/ao.45.005066

[10] L. Rindorf and O. Bang: J. Opt. Soc. Am. B. Vol. 25 (2008), 310-324.

[11] Y. Han, B. H. Lee, W. Han, U. Paek and Y. Chung: Meas. Sci. Technol. Vol. 12 (2001), p.778–781.

[12] Y. Yu, J. Zheng, K. Yi, S. Ruan, C. Du, J. Huang and W. Zhong, Proc. SPIE, 8307 (2011), 83071W.

[13] B.H. Lee and J. Nishii: Appl. Opt. Vol. 38, (1999). pp.3450-3459.

[14] J. F. Ding, A. P. Zhang, L. Y. Shao, J. H. Yan and S. He: IEEE Photonic Tech. Lett. Vol. 17 (2005), pp.1247-1249.

[15] Y. Fan, T. Zhu, L. Shi, and Y. Rao: Appl. Opt. Vol. 50 (2011), pp.4604-4610.

[16] J. Ju, W. Jin and H. L. Ho: IEEE Photonic Tech. Lett. Vol. 20 (2008), p.1899-(1901).