Nanoholes with Defects Fabricated by Focused Ion Beam Milling

Xiao Xiao Jiang; Qiong Chan Gu; Feng Wen Wang; Zhen He Ma; Jiang Tao Lv; Guang Yuan Si

doi:10.4028/www.scientific.net/AMR.661.70

Paper Titles

Preparation and Characterization of NiO Nanoarrays with Different Hierarchical Porous Structure
p.53

First-Principles Study on Electronic Structure and Magnetic Properties of Freestanding Ni Nanobelts
p.57

Investigation on the Frequencies of Radial Breathing Mode and Radial Breathing-Like Mode of Carbon Nanotubes
p.62

Arbitrary Structures Fabricated by Focused Ion Beam Milling
p.66

Nanoholes with Defects Fabricated by Focused Ion Beam Milling
p.70

Preparation and Fluorescence Properties of GdF₃:Eu³⁺, NaGdF₄:Eu³⁺ Materials
p.74

Study on the Composite Spinning Co-Extrusion Process of the Tri-Component
p.81

Preparation and Characterization of mPEG Modified Magnetic Long-Circulating Doxorubicin Hydrochloride Liposomes
p.87

Influence of Anvil Geometry on Stretching Process of Cylinder Forging with Materials Properties in Materials Engineering
p.91

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 661Nanoholes with Defects Fabricated by Focused Ion...

Nanoholes with Defects Fabricated by Focused Ion Beam Milling

Abstract:

Subwavelength nanohole arrays have been thoroughly studied for years. However, investigations on nanoholes with defects are seldom reported. Here, we study the optical properties of nanohole arrays with different defects which are fabricated by focused ion beam lithography. Finite difference time domain simulations are also performed to verify the experimental results. Our approach may find extensive applications in sensing and optical waveguiding.