Structural, Optical and Electrical Characteristics of Polycrystalline ZnO Thin Film Prepared by Sol-Gel Spin-Coating Method

Abstract:

The effect of annealing temperatures on the Zinc Oxide (ZnO) thin films properties has been investigated. 1.0 M ZnO solution was prepared by sol-gel method as coating solution for ZnO thin films deposition process. The thin films deposition was conducted by spin-coating technique on the silicon and glass substrates. The scanning electron microscopy (SEM) images reveal the evolution of ZnO surface morphology with annealing temperatures. The crystallinity improvement occurred at higher annealing temperature as shown by x-ray diffraction (XRD) result. The optical properties found to be varied at different annealing temperatures. The current-voltage (I-V) measurement results suggested the improvement of ZnO thin film electrical properties with annealing temperatures.

• Periodical: Advanced Materials Research (Volume 667)
• Pages: 24-29
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.667.24
• Online since: March 2013
• Authors: Mohamad Hafiz Mamat, A.A.A. Halim, Mohd Zainizan Sahdan, S. Amizam, Zuraida Khusaimi, Mohamad Rusop
• Keywords: Aluminum Doped Zinc Oxide, Sol-Gel Spin-Coating Method, UV Photoconductive Sensor

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