Optical Properties of Al Doped Zinc Oxide Nanorods Thin Film Deposited by Immersion Technique

S.Z. Muhamed; Mohamad Hafiz Mamat; Mohamad Rusop

doi:10.4028/www.scientific.net/AMR.667.388

Paper Titles

Electrical and Structural Properties of TiO₂Thin Film Prepared at Different Annealing Temperatures by Sol-Gel Spin-Coating Method
p.371

Zinc Oxide Nanorods Characteristics Prepared by Sol-Gel Immersion Method Immersed at Different Times
p.375

Characteristics of Humidity Sensor Fabricated Using Nanostructured ZnO Thin Film by Sol-Gel Method
p.380

Electrical Characteristic of UV Sensor Using Nanostructured Al Doped ZnO Thin Film
p.384

Optical Properties of Al Doped Zinc Oxide Nanorods Thin Film Deposited by Immersion Technique
p.388

Diode Characteristics of Zinc Oxide Thin Film at Different Deposition Time for FET Applications
p.393

Effect of Etching Time on Electrical and Optical Properties of Porous Silicon
p.397

Effect of Different Solvents on the Optical Properties and Surface Morphology of MEH-PPV Thin Films
p.402

The Effect of Deposition Time on the Structural Properties of ZnO Nanorods Prepared by Sol-Gel Immersion Method
p.407

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 667Optical Properties of Al Doped Zinc Oxide Nanorods...

Optical Properties of Al Doped Zinc Oxide Nanorods Thin Film Deposited by Immersion Technique

Abstract:

We investigated the effect of immersion time on optical, electrical properties and surface morphology of nanostructured Aluminium (Al) doped Zinc Oxide (ZnO) thin films prepared by immersion technique. UV-Vis-NIR spectra indicate that the transmittance of the samples decrease with immersion time. Electrical properties study reveals the nanostructured Al doped ZnO thin film at 1 hr shows the lowest resistivity compared to other samples. Surface morphology results as characterized by scanning electron microscope (SEM) show that the Al doped ZnO nanorods quantity increased with immersion time.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 667)

Pages:

388-392

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.667.388

Citation:

Cite this paper

Online since:

March 2013

Authors:

S.Z. Muhamed, Mohamad Hafiz Mamat, Mohamad Rusop

Keywords:

FESEM, Immersion Technique, Nanorod, Nanostructured Al-Doped ZnO, Optical Property, Scanning Electron Microscope (SEM)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] G. Srinivasan, N. Gopalakrishnan, Y.S. Yu, R. Kesavamoorthy, J. Kumar, Superlattices and Microstructures 43 (2008) 113.

Google Scholar

[2] U. Oezguer, Y. Alivov, C. Liu, A. Teke, M. Reshchikov, S. Dogan,V. Avrutin, S. Cho, H. Morkoc, J. Appl. Phys. 98 (2005) 041 301.

Google Scholar

[3] Tae-Hyoung Moon, Min-Chang Jeong, Woong Lee, Jae-Min Myoung, Applied Surface Science 240 (2005) 280.

Google Scholar

[4] Benny Joseph, K.G. Gopchandran, P.V. Thomas, Peter Koshy, V.K. Vaidyan, Materials Chemistry and Physics 58 (1999) 71.

Google Scholar

[5] Y. Natsume and H. Sakata, Thin Solid Films 372 (2000) 31.

Google Scholar

[6] Zikun Li, Xintang Huang, Jinping Liu, Yuanyuan Li, Guangyun Li, Materials Letters 62 (2008) 1503.

Google Scholar

[7] H. Deng, J.J. Russell, R.N. Lamb, B. Jiang, Y. Li, X.Y. Zhou, Thin Solid Films 458 (2004) 43.

Google Scholar

[8] Vinay Gupta, P. Bhattacharya, Yu. I. Yuzuk, K. Sreenivas, R.S. Katiyar, Journal of Crystal Growth 287 (2006) 39.

Google Scholar