Improving Processes on ZnO-Based Ultraviolet Photodetector

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This paper summarized the improving processes, such as, microstructure and surface modifications, appropriate dopants and nanostructural forms, to obtain sensitive, fast, and enhanced ultraviolet (UV) photoresponse in ZnO thin films. Furthermore, recent research progress in this field and some development features in future are also briefly analyzed.

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195-200

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April 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] E. Monroy, F. Omnes and F.Calle: Semicond. Sci. Technol. Vol. 18 (2003), p. R33

Google Scholar

[2] A. Vasudevan, S. Jung and Taeksoo Ji: IEEE Sensor J. Vol. 12 (2012), p.1317

Google Scholar

[3] A. Ohtomo, M. Kawasaki, Y. Sakurai, I. Ohkubo, R. Shiroki, Y. Yoshida, T. Yasuda, Y. Segawa and H. Koinuma: Mater. Sci. Eng. B Vol. 56 (1998), p.263

DOI: 10.1016/s0921-5107(98)00218-9

Google Scholar

[4] Y. Chen, D.M. Bagnall, H. Koh, K. Park, K. Hiraga, Z. Zhang and T. Yao: J. Appl. Phys. Vol. 84 (1998), p.3912

Google Scholar

[5] F.D. Auret, S.A. Goodman, M. Hayes, M.J. Legodi, H.A. Van Laarhoven and D.C. Look: Appl. Phys. Lett. Vol. 79 (2001), p.3074

Google Scholar

[6] T. Ma, M. Guo, M. Zhang, Y. Zhang and X. Wang: Nanotechnology Vol. 18 (2007), p.035605

Google Scholar

[7] S.S. Hullavarad, N.V. Hullavarad, P.C. Karulkar, A. Luykx and P. Valdivia: Nanoscale Res. Lett. Vol. 2 (2007), p.161

DOI: 10.1007/s11671-007-9048-6

Google Scholar

[8] J. Lia, Y. Xu, T.Y. Hsiang and W.R. Donaldson: Appl. Phys. Lett. Vol. 84 (2004), p. (2091)

Google Scholar

[9] O. Katz, G. Bahir and J. Salzman: Appl. Phys. Lett. Vol. 84 (2004), p.4092

Google Scholar

[10] Y.Z. Chiou, Y.K. Su, S.J. Chang, J. Gong, Y.C. Lin, S.H. Liu and C.S. Chang: IEEE J. Quantum Electron Vol. 39 (2003), p.681

Google Scholar

[11] P. Bhattacharya, R.R. Das and R.S. Katiyar: Appl. Phys. Lett. Vol. 83 (2003), p. (2010)

Google Scholar

[12] K. Moazzami, T.E. Murphy, J.D. Phillips, M.C.K. Cheung and A.N. Cartwright: Semicond. Sci. Technol. Vol. 21 (2006), p.717

Google Scholar

[13] H.L. Porter, A.L. Cai, J.F. Muth and J. Narayan: Appl. Phys. Lett. Vol. 86 (2005), p.211918

Google Scholar

[14] H.K. Yadav, K. Sreenivas and Vinay Gupta: J. Appl. Phys. Vol. 107 (2010), p.044507

Google Scholar

[15] P.H. Miller and Jr.: Proc. Photoconductivity Conf. (New York:Wiley, 1956), p.287

Google Scholar

[16] Erich Mollwo, Proc. Photoconductivity Conf. (New York:Wiley, 1956), p.509

Google Scholar

[17] D.H. Zhang: J. Phys. D Appl. Phys. Vol. 28 (1995), p.1273

Google Scholar

[18] Y. Takahashi, M. Kanamori, A. Kondoh, H. Minoura and Y.Ohya: Jpn. J. Appl. Phys. Vol. 33 (1994), p.6611

Google Scholar

[19] D.H. Zhang and D.E. Brodie: Thin Solid Films Vol. 261 (1995), p.334

Google Scholar

[20] Y. Liu, C.R. Gorla, S. Liang, N. Emanetoglu, Y. Lu, H. Shen and M. Wraback: J. Electron. Mater. Vol. 29 (2000), p.69

Google Scholar

[21] K Moazzami, T.E. Murphy, J.D. Phillips, M.C-K. Cheung and A.N. Cartwright: Semicond. Sci. Technol. Vol. 21 (2006), p.717

Google Scholar

[22] L.W. Ji, C.Z. Wu, S.J. Young, K.T. Lam, W. Water, Y.F. Chen, C.H. Liu, T.H. Meen and T.H. Fang: International Symposium on Computer, Communication, Control and Automation (2010), p.546

Google Scholar

[23] Y. Takahashi, M. Kanamori, A. Kondoh, H. Minoura and Y. Ohya: Jpn. J. Appl. Phys. Vol. 33 (1994), p.6611

Google Scholar

[24] D.H. Zhang and D.E. Brodie: Thin Solid Films Vol. 251 (1994), p.151

Google Scholar

[25] S.A. Studenikin, N. Golego and M. Cocivera: J. Appl. Phys. Vol. 87 (2000), p.2413

Google Scholar

[26] H.Y. Kim, J.H. Kim, Y.J. Kim, K.H. Chae, C.N. Whang, J.H. Songand and S. Im: Opt. Mater. Vol. 17 (2001), p.141

Google Scholar

[27] P. Sharma, K. Sreenivas and K.V. Rao: J. Appl. Phys. Vol. 93 (2003), p.3963

Google Scholar

[28] W. Yang, R.D. Vispute, S. Choopun, R.P. Sharma, T. Venkatesan and H.Shen: Appl. Phys. Lett. Vol. 78 (2001), p.2787

Google Scholar

[29] H.L. Porter, A.L. Cai and J.F. Mutha: Appl. Phys. Lett. Vol. 86 (2005), p.211918

Google Scholar

[30] N.Wang, Y. Cai and R.Q. Zhang: Mater. Sci. Eng. R Vol. 60 (2008), p.1

Google Scholar

[31] A. Kolmakov and M. Moskovits: Annu. Rev. Mater. Res. Vol. 34 (2004), p.151

Google Scholar

[32] C.N.R. Rao, F.L. Deepak, G. Gundiah and A. Govindaraj: Prog. Solid State Chem. Vol. 31 (2003), p.5

Google Scholar

[33] D. Park and K. Yong: J. Vac. Sci. Technol. B Vol. 26 (2008), p. (1933)

Google Scholar

[34] C.Y. Lu, S.P. Chang, S.J. Chang, T.J. Hsueh, C.L. Hsu, Y.Z. Chiou and I.C. Chen: IEEE Sensors J. Vol. 9 (2009), p.485

Google Scholar

[35] T. Zhai, X. Fang, M. Liao, X. Xu, H. Zeng, B. Yoshio and D. Golberg: Sensors Vol. 9 (2009), p.6504

Google Scholar

[36] R. Savu, R. Parra, B. Jančar, M.A. Zaghete and E. Joanni: IEEE Sensors J. Vol. 11 (2011), p.1820

Google Scholar

[37] H. Kind, H.Q. Yan, B. Messer, M. Law and P.D. Yang: Adv. Mater. (Weinheim,Ger.) Vol. 14 (2002), p.158

Google Scholar

[38] D. Park and K. Yong: J. Vac. Sci. Technol. B 26 (2008), p. (1933)

Google Scholar

[39] G. Cheng, X.H. Wu, B. Liu, B. Li and X.T. Zhang: Appl. Phys. Lett. Vol. 99 (2011), p.203105

Google Scholar

[40] H.Y. Lee, H.L. Huang and C.T. Lee: IEEE Photon. Technol. Lett.: Vol. 23 (2011), p.706

Google Scholar

[41] C. Soci, A. Zhang, B. Xiang, S.A. Dayeh, D.P.R. Aplin, J. Park, X.Y. Bao, Y.H. Lo and D. Wang: Nano Lett. Vol. 7 (2007), p.1003

DOI: 10.1021/nl070111x

Google Scholar