Growth and Thermal Characterization of Yb:Y0.923Lu0.071VO4

Shi Ming Zhang; Bing Teng; De Gao Zhong; Bing Tao Zhang; Shu Jie Zhuang; Hui Xu; Jian Hong Li; Romano A. Rupp

doi:10.4028/www.scientific.net/AMR.709.192

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 709Growth and Thermal Characterization of...

Growth and Thermal Characterization of Yb:Y_0.923Lu_0.071VO₄

Abstract:

A new mixed laser crystal, Yb0.006Y0.923Lu0.071VO4, has been successfully grown using the Czochralski method. X-ray powder diffraction analysis shows that the crystal has ZrSiO4 structure. Density, thermal expansion coefficients, specific heat and thermal diffusion coefficients were measured, and the thermal conductivity coefficients were determined.

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Advanced Materials Research (Volume 709)

Pages:

192-196

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.709.192

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Online since:

June 2013

Authors:

Shi Ming Zhang, Bing Teng, De Gao Zhong, Bing Tao Zhang, Shu Jie Zhuang, Hui Xu, Jian Hong Li, Romano A. Rupp

Keywords:

Czochralski Method, Structure, Thermal Characterization, Vanadates

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