The Research on Degradation Failure Life and Degradation Data Structure

Abstract:

In order to solve the reliability assessment in the case of competition failure induced by the coexistence between burst-type failure and degradation-type failure in the product, the method of degradation amount distribution was adopted to describe the degradation process of performance in product. Considering the relativity between sudden failure and degradation degree, the cumulative distribution function of sudden failure was calculated from the standpoint of degradation amount. Eliminating the affect of sudden failure according to a certain conditional probability in the degradation amount distribution function, which helps to realize reliability assessment based on competitive failure analysis.

• Periodical: Advanced Materials Research (Volume 710)
• Pages: 294-297
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.710.294
• Online since: June 2013
• Authors: Yi Dong Wang, Yi Zhou He, Hai Bo Liu, Jun Wei Lei
• Keywords: Data Structure, Degradation, Reliability Assessment, Sudden Failure

References

[1] Nelson, W.B. Analysis of performance-degradation data from accelerated tests. IEEE Transactions on Reliability, 1981, 30(2):149~154

DOI: 10.1109/tr.1981.5221010

[2] Chan, C.K, Boulanger, M., Tortorella, M. Analysis of parameter-degradation data using life-data analysis programs. Proceedings Annual Reliability and Maintainability Symposium. 1994:288-291

DOI: 10.1109/rams.1994.291122

[3] Su Deqing. The Research Report on Degradation model of Accelerated Life Testing Parameters on Microwave Low Noise GaAsFET. China Electronics Standardization Institute. (1992)

[4] Zio E．Reliability engineering:old problems and new challenges[J]．Reliability Engineering and System Safety,2009,94(2):125-141

DOI: 10.1016/j.ress.2008.06.002

[5] Lu J C,Meeker W Q．Using degradation measures to estimate a time-to-failure distribution[J]．Technometrics, 1993,35(2):161-174．

DOI: 10.1080/00401706.1993.10485038

[6] Meeker W Q,Escobar L A．Statistical methods for reliability data[M]．John Wiley & Sons, New York,(1998)

[7] Chao M T．Degradation analysis and related topics:some thoughts and a review[J]．Proceedings of the National Science Council,1999,23(5):555-56

[8] Wilson S P,Taylor D．Reliability assessment from fatigue micro-crack data[J]．IEEE Transactions on Reliability,1997,46(2):165-171

DOI: 10.1109/24.589943

[9] Place C S,Strutt J E,Allsopp K．Reliability prediction of helicopter transmission systems using stress-strength interference with underlying damage accumulation[J]．Quality and Reliability Engineering International,1999,15(2):69-78

DOI: 10.1002/(sici)1099-1638(199903/04)15:2<69::aid-qre232>3.0.co;2-#

[10] Owen W J,Padgett W J．A birnbaum-saunders accelerated life model[J]．IEEE Transactions on Reliability,2000,49(2):224-229

DOI: 10.1109/24.877342

[11] Meeker W Q,Luvalle M J．An accelerated life test model based on reliability kinetics[J]．Technometrics,1995,8(37):133-146

DOI: 10.1080/00401706.1995.10484298

[12] Carey M B,Koenig R H．Reliability assessment based on accelerated degradation:a case study[J]．IEEE Transactions on Reliability,1991,40(5):499-506

DOI: 10.1109/24.106763

[13] Ramirez J G,Gore W L,Johnston G．New methods for modeling reliability using degradation data[J]．Statistics Data Analysis and Data Mining,2001,9(5):263-226

[14] Meeker W Q, Escobar L A． Accelerated degradation tests: modeling and analysis[J]． Technometrics,1998,40(2):89-99

DOI: 10.1080/00401706.1998.10485191

[15] Tang L C,Chang D S．Reliability prediction using nondestructive accelerated-degradation data:case study on power supplies[J]．IEEE Transactions on Reliability,1995,44(4):462-566

DOI: 10.1109/24.475974

[16] Chen Zehua,Zheng Shurong．Lifetime distribution based degradation analysis[J]．IEEE Transactions on Reliability,2005,54(1):3-10

[17] Suk J B,Kim S J,Kim M S．Degradation analysis of nano-contamination in plasma display panels[J]．IEEE Transactions on Reliability,2008,57(2):222-229

DOI: 10.1109/tr.2008.917823