A Method to Extract Contour of Wheat Pests Based on LCV Model

Jian Li; Li Juan Wang; Xue Tao Zhang; Yi Li

doi:10.4028/www.scientific.net/AMR.718-720.2344

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 718-720A Method to Extract Contour of Wheat Pests Based...

A Method to Extract Contour of Wheat Pests Based on LCV Model

Abstract:

A method to extract contour of wheat pests based on LCV model is proposed in this paper. This method uses calculation of the weighted average gray value of the partial window function to replace the global mean value, and added the constraint level set function as a the energy term of signed distance function to avoid the re-initialization of the level set function. This method can be extracted the contour of wheat pests effectively, and thus it improves the efficiency of the extraction of wheat pests shape feature. The effectiveness of this method is verified by MATLAB simulation experiments.

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Periodical:

Advanced Materials Research (Volumes 718-720)

Pages:

2344-2347

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.718-720.2344

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Online since:

July 2013

Authors:

Jian Li, Li Juan Wang, Xue Tao Zhang, Yi Li

Keywords:

Contour Extraction, LCV Model, Wheat Pests

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References

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