Attention Electroencephalogram Analysis Based on Jensen-Shannon Divergence Analysis

Zheng Zhong Zheng; Jun Chang Zhao; Xiao Lin Huang; Jun Wang

doi:10.4028/www.scientific.net/AMR.749.254

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 749Attention Electroencephalogram Analysis Based on...

Attention Electroencephalogram Analysis Based on Jensen-Shannon Divergence Analysis

Abstract:

In this paper, the complexity analysis method based on Jensen-Shannon Divergence was used to calculate the complexity of the Idle states, the close eyes states and the count numbers states electroencephalogram. The study found that the JSD value of close eyes states EEG was highest, followed by that of the Idle states EEG, and that of the count numbers states EEG was minimum. The result can be used to assisted clinical diagnosis.

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Periodical:

Advanced Materials Research (Volume 749)

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254-257

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.749.254

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Online since:

August 2013

Authors:

Zheng Zhong Zheng, Jun Chang Zhao, Xiao Lin Huang, Jun Wang

Keywords:

Complexity Electroencephalogram, Jensen-Shannon Divergence

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