Scanning Electron Microscopic Study of Rotary Nickel-Titanium Endodontic File (RNEF)

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Abstract:

This study examined RNEF with scanning electron microscope (SEM), for surface flaws, internal voids and inclusions. Six commercial brands of 4% taper RNEF: PF (#25, 25mm, Dentsply Tulsa Dental Specialties, Tulsa, OK), GTX (#20, 25mm, Dentsply Tulsa Dental Specialties, Tulsa, OK), NRT (#25, 25mm, MANI Inc., Tochigi, Japan), FKG (#25, 25mm, FKG, Dentaire), K3 (#25, 25mm) and TF (Twisted File #25, 27mm) (Sybron Kerr, Orange, CA) were examined. Full length and 4mm segment of each RNEF brand was mounted in Al plate for surface morphology and conductive epoxy resin for cross-sectional imaging with SEM (JEOL JSM-820) respectively. EDX spectrum was collected from specimens with EDX spectrometer coupled to SEM. EDX software was used for quantitative analysis. This study demonstrated the existence of surface flaws as machining marks, notches, crevices, fissures and pits. Internal voids of micro-to sub-micrometer magnitude were observed. Ti-rich inclusions were found dispersed in the equiatomic to near-equiatomic NiTi substrate of RNEF. Surface flaws, internal voids and inclusions were common findings on RNEF studied. Their effects on the corrosion and fatigue resistance of RNEF deserve further investigation.

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262-269

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August 2013

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[1] H.M. Walia, W.A. Brantley, and H. Gerstein: J. Endod. Vol. 14 (1988), p.346–351.

Google Scholar

[2] O.A. Peters, in: Colleagues for Excellence Newsletter, American Association of Endodontists, Chicago, Winter 2008, pp.1-6.

Google Scholar

[3] A.L. McKelvey and R.O. Ritchie: Met. Mater. Trans. A. Vol. 32A (2001), p.731–743.

Google Scholar

[4] Y. Shen, J.M. Coil, and M. Haapasalo: J. Endod. Vol. 35 (2009), p.193–196.

Google Scholar

[5] C.H. Fleming, M.S. Litaker, L.W. Alley and P.D. Eleazer : J. Endod. Vol. 36 (2010), p.414–418.

Google Scholar

[6] Y. Shen, M. Haapasalo, G.S.P. Cheung: J. Endod. Vol. 35 (2009), p.129–132.

Google Scholar

[7] P. Parashos, H.H. Messer: J. Endod. Vol. 32 (2006), p.1031–1043.

Google Scholar

[8] D. Tomus, K. Tsuchiya K, M. Inuzuka, M. Sasaki, D. Imai, T. Ohmori, M. Umemoto: Scripta Mater. Vol. 48 (2003), p.489 –494.

DOI: 10.1016/s1359-6462(02)00510-9

Google Scholar

[9] J. Mentz, J. Frenzel, M.F.X. Wagner, K. Neukin, G. Eggeler, H.P. Buchkremer, D. St¨over: Mater. Sci . Eng. A, Vol. 491 (2008), p.270—278.

Google Scholar

[10] G. Alexandrou, K. Chrissafis, L. Vasiliadis, E. Pavlidou, and E.K. Polychroniadis: Int. Endod. J. Vol. 39 (2006), p.770–778.

DOI: 10.1111/j.1365-2591.2006.01147.x

Google Scholar

[11] C. Pirani, P.P. Cirulli, S. Chersoni, L. Micele, O. Ruggeri, and C. Prati: J. Endod. Vol. 37 (2011), p.1013–1016.

DOI: 10.1016/j.joen.2011.04.009

Google Scholar

[12] A. Bonaccorso, E. Schäfer, G.G. Condorelli, G. Cantatore, T.R. Tripi: J. Endod. Vol. 34 (2008), p.1391–1395.

Google Scholar

[13] T.R. Tripi, A. Bonaccorso, G.G. Condorelli: Oral Surg. Oral Med. Oral Pathol. Oral Radiol. Endod. Vol. 102 (2006), p. e106–e114.

DOI: 10.1016/j.tripleo.2005.12.012

Google Scholar

[14] M. Kataya, S. Ibrahim, G.E.H. Eid, I. El-Mahallawi: Engineering Failure Analysis. Vol. 18 (2011), p.1775 –1783.

DOI: 10.1016/j.engfailanal.2011.03.030

Google Scholar

[15] J.T. Wu, G. Lei, M. Yan, Y. Yu, J.H. Yu and G.D. Zhang: J. Endod. Vol. 37 (2011), p.758–763.

Google Scholar

[16] A. Versluis, H.C. Kim, W.C. Lee, B.M. Kim and C.J. Lee: J. Endod. Vol. 38 (2012), p.1399–1403.

Google Scholar

[17] R.C.T. Wu and C.Y. Chung: JMEPEG Vol. 21 (2012), p.2515–2518.

Google Scholar

[18] U. Inan and N. Gonulol: J. Endod. Vol. 35 (2009), p.1396–1399.

Google Scholar

[19] J.Y. Kim, G.S.P. Cheung, S.H. Park, D.C. Ko, J.W. Kim and H.C. Kim: J. Endod. Vol. 38 (2012), p.527–530.

Google Scholar

[20] A. Makeev, Y. Nikishkov and E. Armanios: Int. J. Fatigue Vol. 29 (2007), p.141–145.

Google Scholar

[21] T. Kell, A. Azarpazhooh, O.A. Peters, O. El-Mowafy, B. Tompson, and B. Basrani: J. Endod. Vol. 35 (2009), p.1278–1281.

DOI: 10.1016/j.joen.2009.05.005

Google Scholar

[22] A. Bonaccorso, T.R. Tripi, G. Rondelli, G.G. Condorelli, G. Cantatore and E. Schäfer: J. Endod. Vol. 34 (2008), p.208–211.

Google Scholar

[23] C. Praisarnti, J.W.W. Chang and G.S.P. Cheung: J. Endod. Vol. 36 (2010), p.1354–1357.

Google Scholar

[24] B. Khayat and J.C. Michonneau, in: Asia-Pacific Dental News (09. 2012-11. 2012) of Technique Tearout, pp.17-19. www. dentalHUB. net.

Google Scholar

[25] C.M. Larsen, I. Watanabe, G.N. Glickman and J.N. He.: J. Endod. Vol. 35 (2009), p.401–403.

Google Scholar

[26] TF rotary endodontic file: manufacturer's web site. Information on: http: /www. sybronendo. com.

Google Scholar

[27] S. Zinelis, T. Eliades and G. Eliades: Int. Endod. J. Vol. 43 (2010), p.125–134.

Google Scholar

[28] S.A. Thompson: Int. Endod. J. Vol. 33 (2000), p.297–310.

Google Scholar

[29] E.O. Kirkendall: Trans. A.I.M.E. Vol. 147 (1942), P. 104.

Google Scholar

[30] A. Kwangjin and H. Taeghwan: Nano Today. Vol. 4 (2009), pp.359-373.

Google Scholar

[31] H.F. Ounsi, T. Al-Shalan, Z. Salameh, S. Grandini and M. Ferrari: J. Endod. Vol. 34 (2008), p.53 – 55.

Google Scholar

[32] M. He, W.H. Lau, G. Qi and Z. Chen: Thin solid Films Vol. 462-3 (2004), pp.376-383.

Google Scholar