A Universal Test Scheme for Power Conversion Embedded Control System with Full-Coverage on Inner Variables

Abstract:

Embedded system becomes one of widely-employed system schemes applied in broad areas, such as power conversion, industrial control, test and measurement, and so on. A universal test scheme with full-coverage on inner variables is present, which will improve the testability of power conversion embedded control system. Feathers of this embedded control system are introduced, and the function structure of the general test scheme is described. Some key problems of the test scheme, such as data type, variable property table, multi-type pointer array, and multi-type data packing and unpacking are discussed. Finally, the effect of the universal test scheme is testified by the implementation of a typical power conversion demonstration.

• Periodical: Advanced Materials Research (Volumes 753-755)
• Pages: 2632-2636
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.753-755.2632
• Online since: August 2013
• Authors: Kai Cai, Bin Liu, Hui Ouyang, Zheng Xi Xu
• Keywords: Embedded System, Full-Coverage, Power Conversion, Test Scheme

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