The Application of Non-Destructive Testing Based on Terahertz Technology in the Field of Smart Grid

Abstract:

The terahertz technology involves electromagnetics, semiconductor physics, optoelectronics, materials science and micro-processing technology and other disciplines. Based on terahertz technology, non-destructive testing has important research value and application prospect in the field of medical imaging, security checking, product testing and power system monitoring. The generation of terahertz technology and its advantages is described in this article, and an analysis is also given on the application of non-destructive testing based on terahertz technology in the field of smart grid such as cable accident warning, intelligent anti-theft system and electronic components monitoring.

• Periodical: Advanced Materials Research (Volumes 760-762)
• Pages: 409-412
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.760-762.409
• Online since: September 2013
• Authors: Xiao Juan Li, Ming Wang, Xiao Bin Liang, Xian Long Zhao, Ming Fei Zhao
• Keywords: Nondestructive Testing (NDT), Smart Grid (SG), Terahertz Technology

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