Test Methods Research and Verify for FPGA

Ji Shi Shu; Yuan Sheng Liu

doi:10.4028/www.scientific.net/AMR.760-762.867

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 760-762Test Methods Research and Verify for FPGA

Test Methods Research and Verify for FPGA

Abstract:

This paper mainly introduces the principle and usage of dynamic probe technology, and makes comparisons between traditional test method and the most popular debugging methodutilizes the embedded tool of debugging on chip to debug. The research depends on self-designed FPGA test service system based on dynamic probe technology. It also explores how to use existent tools and technology for high efficiency test method in FPGA debug and verify process. Through comparisons, it is possible conclude that dynamic probe technology is able to cope with the complex test requirements, and provide more accurate sampling data than the general method in the debugging process. More importantly, the dynamic probe can complete switching a group of the internal signal to be measured within a few seconds, which greatly reducing the waiting time of debugging.

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Periodical:

Advanced Materials Research (Volumes 760-762)

Pages:

867-871

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.760-762.867

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Online since:

September 2013

Authors:

Ji Shi Shu, Yuan Sheng Liu

Keywords:

Dynamic Probe, FPGA Test, SignalTap II

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References

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