Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy

Zhen Ying Xu; Shu Yuan Gao; Jun Huang; Yun Wang

doi:10.4028/www.scientific.net/AMR.764.9

Paper Titles

Preface

Experimental Study on Milling Force of Nickel-Based High-Temperature Alloy GH3039
p.3

Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy
p.9

Process Experimental Research of Micro-Hole in Electrochemical Micromachining by Nanosecond Pulse Current
p.15

Study about Formation Mechanism of Red Spark Discharge of Micro-Arc Oxidation
p.21

By External Forces Based on the Equivalent Moment Method for the Installation of an Electronic Radar Rod Deflection
p.27

Grinding Technology for Engineering Ceramics - A Review
p.31

A Study on the Structure and Properties of Metal Framework Steering Wheel Coated with Polyurethane
p.39

Fabrication and Fracture Analyses of SiC Particulate-Reinforced Al Matrix Composites
p.43

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 764Non-Destructive Testing of Polycrystalline Silicon...

Non-Destructive Testing of Polycrystalline Silicon Solar Panel by Scan Acoustic Microscopy

Abstract:

The inner structure and defects of the silicon panel will influence the transfer efficiency and the stability of the polycrystalline solar cells, thus the non-destructive testing of the silicon panel is very important. In this paper, a Scan Acoustic Microscopy is applied to test the inner structure of polycrystalline silicon solar panel. From the grey image of C-Scan by the microscopy, the amplitude distribution of the bottom wave generated by the interaction between the inner grains of the polycrystalline silicon and the acoustic beam can be seen clearly. Furthermore, the defects as well as their size and position can also be tested by A-Scan, B-Scan and C-Scan with high resolution and high accuracy. The experiment results show that it is a good non-destructive method to test and evaluate the quality of the inner structure of polycrystalline silicon solar panel.

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Periodical:

Advanced Materials Research (Volume 764)

Pages:

9-13

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.764.9

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Online since:

September 2013

Authors:

Zhen Ying Xu, Shu Yuan Gao, Jun Huang, Yun Wang

Keywords:

Defect, Nondestructive Testing (NDT), Polycrystalline Silicon, Scan Acoustic Microscopy, Solar Panel

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