Thermal Non-Destructive Testing for the Titanium Implants

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Abstract:

Active thermal NDT is a promising technique for the detection of structural defects in solids. In this paper, the results of the first-stage research devoted to infrared thermographic detection of cracks in titanium alloys are presented. The test results obtained show that the Fourier analysis is a convenient data processing technique in active thermal NDT. Images of phase are more noise-resistant and able to reveal deeper defects compared to images of amplitude. In application to the inspection of bottom-hole defects in 9.6 mm-thick Ti6Al4V titanium alloy samples, it has been found that a minimum detected defect should have diameter from one to two times greater than its depth.

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Periodical:

Advanced Materials Research (Volumes 785-786)

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52-57

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September 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] Xavier P.V. Maldague, Patrick O. Moore, Nondestructive Testing Handbook Infrared and Thermal Testing, American Society for Nondestructive Testing, (2001).

Google Scholar

[2] Xavier P.V. Maldague, Theory and Practice of Infrared Technology for Nondestructive Testing. New York, John Wiley&Sons, (2001).

Google Scholar

[3] N.P. Avdelidis, A look on thermography: from passive to active NDT & E surveys. SPIE, 2007, 6541: 654115-1-9.

DOI: 10.1117/12.719205

Google Scholar

[4] X. Maldague, Marinetti. S, J. Appl. Phys. 1996, 79(5): 2694-2698.

Google Scholar

[5] Hernán D. Benítez, Clemente Ibarra-Castanedo, Abdel Hakim Bendada et al, Infrared Physics & Technology, 2008, 51(3): 160-167.

Google Scholar

[6] Marinetti S., Grinzato E., Bison P.G. et al, Infrared Phys. & Technol., 2005, 46: 85-91.

Google Scholar

[7] C. Ibarra-Castanedo, X. Maldague, Defect Depth Retrieval from Pulsed Phase Thermographic Data on Plexiglas and Aluminum Samples, Thermosense XXXI, SPIE 2004, 5405: 523-531.

DOI: 10.1117/12.540855

Google Scholar

[8] Sung Quek, Darryl Almond, Luke Nelson, et al. Sci. Technol., 16 (2005): 1223-1233.

Google Scholar

[9] Aamodt L C, Maclachlan J W, Murphy J C , J. Appl. Phys. 1990, 68(12): 6087-6097.

Google Scholar

[10] Hernán D. Benítez, Clemente Ibarra-Castanedo, Abdel Hakim Bendada et al. Infrared Physics & Technology, 2006, 48: 16-21.

Google Scholar

[11] Vavilov V.P. Thermal/Infrared NDT (Handbook), Moscow, Spektr Publisher, 2006. 475 P.

Google Scholar

[12] Favro L. D., Newaz G. M., Thomas R. L. et al, Progress in thermosonic crack detection for Nondestructive Evaluation, DARPA Prognosis Bidder's Conference, USA, 2002, 25-26.

Google Scholar

[13] Takahide Sakagami, Shiro Kubo, Takeshi Endo, Development of a new processing technique of sequential temperature data after pulse heating for quantitative nondestructive testing, Thermosense XXVI, SPIE, 2004, 5405: 357-365.

DOI: 10.1117/12.546477

Google Scholar