Measurement of Trap Stiffness of Holographic Optical Tweezers with Power Spectrum Method

Kai Xu; Jing Li; Gang Du; Chun Li Zhu; Peng Fei Li; Xiao Ping Wu

doi:10.4028/www.scientific.net/AMR.787.423

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 787Measurement of Trap Stiffness of Holographic...

Measurement of Trap Stiffness of Holographic Optical Tweezers with Power Spectrum Method

Abstract:

A microsphere trapped by optical tweezers moves according to the Brownian motion law, which can be described by the Langevin equation. Based on it, a quadrant photodiode (QD) is used to track the displacement of the microsphere with a diameter of 2.5um trapped by holographic optical tweezers, and power spectrum method is adopted to obtain radial trap stiffness. Experiments show that the trap stiffness increases with the increase of the laser power, and decreases as the distance between the optical trap and the inside bottom surface of the sample cell increases.

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Periodical:

Advanced Materials Research (Volume 787)

Pages:

423-426

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.787.423

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Online since:

September 2013

Authors:

Kai Xu, Jing Li, Gang Du, Chun Li Zhu, Peng Fei Li, Xiao Ping Wu

Keywords:

Holographic Optical Tweezers, Power Spectrum Method, Quadrant Photodiode, Trap Stiffness Measurement

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