Artificially Induced Defects in Photonic Crystals and their Optical Properties

Abstract:

An efficient approach for fabricating three-dimensional (3D) photonic crystals (PCs) embedded defects via lithography was introduced. The resulting structures of plan view and cross-section of 3D PCs are characterized by field emission scanning electron microscopy. Ultraviolet-visible transmission spectra show their optical properties. The 3D PCs embedded defects change the center wavelength of photonic band gaps (PBGs) in original PCs, which can be applied in modification and control of the diffraction properties for optical devices.

• Periodical: Advanced Materials Research (Volume 800)
• Pages: 298-301
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.800.298
• Online since: September 2013
• Authors: Juan Li, Hu Yang, Yong Qiang Zhao, Chao Rong Li
• Keywords: 3D PCs, Co-Assembly, Defect, Photolithography

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