Study of Simulation Test Generation Method Based on Improved Binary Particle Swarm Optimization Algorithm

Guang Yao Lian; Peng Cheng Yan; Jiang Sheng Sun; Kao Li Huang

doi:10.4028/www.scientific.net/AMR.823.661

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 823Study of Simulation Test Generation Method Based...

Study of Simulation Test Generation Method Based on Improved Binary Particle Swarm Optimization Algorithm

Abstract:

To solve the backdating problem of traditional test generation methods, it puts forward a new test generation method based on improved binary particle swarm optimization algorithm in the paper. It estates the fitness function of test vector and faults in the circuits, and the optimal solution is the maximal value of the function. The experimentations prove that the method can reduce the compute quantity of test generation.

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Periodical:

Advanced Materials Research (Volume 823)

Pages:

661-664

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.823.661

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Online since:

October 2013

Authors:

Guang Yao Lian, Peng Cheng Yan, Jiang Sheng Sun, Kao Li Huang

Keywords:

BPSO, Simulation, Test Generation

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References

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