ESD Damage Effect Test of Integrated Circuit

Shi Liang Yang; Teng Li; Hong Liang Pan; Lin Dai

doi:10.4028/www.scientific.net/AMR.846-847.425

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 846-847ESD Damage Effect Test of Integrated Circuit

ESD Damage Effect Test of Integrated Circuit

Abstract:

The damage threshold for different terminals is obtained by a direct injection of electromagnetic pulse (EMP) of different magnitudes to different terminals of 54LS series gate circuit, using an electrostatic discharge (ESD) simulator. The test shows that the most sensitive terminal is the output end. The correlation coefficient of damage voltage value of ESD injection and square wave injection is 0.75, which is a high relevance.

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Periodical:

Advanced Materials Research (Volumes 846-847)

Pages:

425-428

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.846-847.425

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Online since:

November 2013

Authors:

Shi Liang Yang*, Teng Li, Hong Liang Pan, Lin Dai

Keywords:

Damage Effect, ESD, Integrated Circuit

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References

[1] Munro N. Electronic Combat and Modern Warfare[R]. Momillan Academic and Professional Press. 1991: 2 ~3.

Google Scholar

[2] Thottappillil, M A Uman. Lightning return stroke model with height variable discharge time constant [J] Geophys. Res, 1994: 22773 ~22780.

DOI: 10.1029/94jd02085

Google Scholar

[3] Marcos Rubinstein, M A Uman, Pedro J Medelius , etc. Measurements of the voltage induce on an overhead power line 20m from triggered lightning[J]. IEEE Tran. On EMC, 1994, 36(2): 31 ~34.

DOI: 10.1109/15.293277

Google Scholar

[4] Electromagnetic Compatibility (EMC)-Part4-2: Testing and Measurement Techniques- Electrostatic Discharges Immunity Test [S], IEC61000-4-2, (2001).

DOI: 10.3403/30143587

Google Scholar