For Libraries For Publication Open Access Downloads About Us Contact Us
Paper Titles
High Precision Fiber DFB Laser Micro-Accelerometer
p.296
The Research on Conductive Fibers Configuration of Antistatic Fabric
p.300
Effect of Electron Beam Irradiation Crosslinking on PVA Films
p.304
Study on Microstructure and Tribological Properties of Graphite-Like Carbon Films
p.309
Effect of Annealing Temperature on Structural and Optical Properties of (Cu, Al):ZnO Thin Film by Sol-Gel Method
p.314
High-Performance Indium Oxide Thin Film Transistor with ITO Source/Drain Electrodes Fabricated by Reactive Sputtering
p.319
Soundscape of Public Space and Design Method
p.327
Research and Application of Information Operation and Maintenance Fault Diagnosis Model for Power Grid Enterprise
p.332
Software Design Methods Research on Configuration Technology
p.337

Effect of Annealing Temperature on Structural and Optical Properties of (Cu, Al):ZnO Thin Film by Sol-Gel Method

Article Preview

Abstract:

The (Cu,Al):ZnO thin films were prepared on glass substrates by sol-gel spin coating technique.The effect of annealing temperature on the structural and optical properties of the (Cu, Al):ZnO thin film was investigated by means of X-ray diffraction and UV-vis spectrophotometer. It has been found that the grain sizes, Optical band gap and the preferred orientation growth of (002) plane were decreased with annealing temperature. the annealing temperature also played a significant role in the blue-shifted phenomenon.

You might also be interested in these eBooks
Material Science and Advanced Technologies in Manufacturing View Preview

Info:

Periodical:

Advanced Materials Research (Volume 852)

Pages:

314-318

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.852.314

Citation:

Cite this paper

Online since:

January 2014

Authors:

Ying Xiang Yang, Qing Nan Shi, Hong Lin Tan*

Keywords:

(Cu, Al): ZnO Thin Film, Optical Band Gap, Sol-Gel

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

References

[1] T.M. Hammad J.K. Salem R.G. Harrison, R. Hempelmann,N. K. Hejazy,J. J Mater Sci: Mater Electron, 24 (2013) 2846–2852.

DOI: 10.1007/s10854-013-1181-7

Google Scholar

[2] F.M. Li, C.T. Zhu, S.Y. Man, A.M. Sun, H.S. Song, X.B. Li, X. Wang, Materials Science in Semiconductor Processing, 16(2013)1079-1085.

Google Scholar

[3] G.H. Kim D.L. Kim B.D. Ahn S.Y. Lee H.J. Kim, Microelectronics Journal, 40(2009) 272-275.

Google Scholar

[4] C.H. Jia, Q.C. Dong, W.F. Zhang, Journal of Alloys and Compounds, 520(2012) 250-254.

Google Scholar

[5] B. Kulyk,B. Sahraoui,V. Figà,B. Turko,V. Rudyk,V. Kapustianyk, Journal of Alloys and Compounds, 481(2009)819-825.

DOI: 10.1016/j.jallcom.2009.03.117

Google Scholar

[6] M. Caglar,F. Yakuphanoglu, Applied Surface Science, 258(2012) 3039-3044.

Google Scholar

[7] Z.C. Pan, X.L. Tian, G.H. Hu, C.M. Xiao, Materials Science in Semiconductor Processing, 16(2013)587-592.

Google Scholar

[8] Y. Caglar, D.D. Oral, M. Caglar, Thin Solid Films, 520(2012) 6642-6647.

DOI: 10.1016/j.tsf.2012.06.064

Google Scholar

[9] F.M. Li, C.T. Zhu, S.Y. Man, A.M. Sun, H.S. Song, X.B. Li, X. Wang, Materials Science in Semiconductor Processing, 16 (2013) 1079-1085.

Google Scholar

[10] J. Liu, W. J Zhang, D.Y. Song, Q. Ma. , Journal of Alloys and Compounds. 575(2013) 174-182.

Google Scholar

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.