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Algorithms for Dynamic Hardness Measurements by Scratch Testing in the Submicron and Nanometer Scale
Abstract:
The automatic scratch geometrical parameters analysis algorithms based on the images obtained by scanning probe microscopy have been developed. We provide a description of the technique to determine the contact area and the scratch volume with and without account of the pile-ups. The developed algorithms are applied to measure the dynamic hardness by sclerometry on the submicron and nanometer scale.
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619-624
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Online since:
December 2013
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© 2014 Trans Tech Publications Ltd. All Rights Reserved
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