Research on Applied Technology by Discovery of Test Configuration Models Based on TTCN-3 Testing Systems

Yong Po Liu; Shuang Mei Liu; Xue Mei Liu; Ji Guang Han

doi:10.4028/www.scientific.net/AMR.859.384

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 859Research on Applied Technology by Discovery of...

Research on Applied Technology by Discovery of Test Configuration Models Based on TTCN-3 Testing Systems

Abstract:

The test configuration and data play an important role in a test system based on Web application. Test configuration is used to describe the number of test components in a test system based on Web application, and the connecting relationship between test components. Aimed at the comprehensibility, reusability and maintainability, the paper presents the test configuration models for the legacy code developed by TTCN-3 based on Web application. It can also help testers and maintainers to verify the test implement, etc. First, the paper introduces the algorithm to discovery the static test configuration model and its features based on TTCN-3 test systems. Then, the paper builds the algorithms to discover the dynamic test configuration models.

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Periodical:

Advanced Materials Research (Volume 859)

Pages:

384-390

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.859.384

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Online since:

December 2013

Authors:

Yong Po Liu, Shuang Mei Liu, Xue Mei Liu, Ji Guang Han

Keywords:

Applied Technology, Dynamic Test Configuration Model, Static Test Configuration Model, Test System, TTCN-3

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