Electrical Characterization of YSZ/YSZ-NiO Grown by Pulsed Laser Deposition for Low Temperature Solid Oxide Fuel Cells

Wen De Liu; Zhen Feng Kang; Qiang Li; Ping Ping Zheng; Tie Zhu Ding

doi:10.4028/www.scientific.net/AMR.860-863.807

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Electrical Characterization of YSZ/YSZ-NiO Grown by Pulsed Laser Deposition for Low Temperature Solid Oxide Fuel Cells

Abstract:

This study is focused on the elaboration of 8 mol.% yttria stabilized zirconia (YSZ) thin films onto porous supporting NiOYSZ anode substrates using pulsed laser deposition (PLD),and their microstructural and electrical characterizations. Better crystallinity and grain connectivity is observed increasing the deposition temperature until best values are obtained at 500°C. The greater relative conductivity enhancement is found at 300-500°C. The observed an increased conductivity at lower temperatures may be caused by a combination of nanoscaled effect of the YSZ thin film and interfacial effects between YSZ thin film and substrate.

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Advanced Materials Research (Volumes 860-863)

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807-811

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.860-863.807

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Online since:

December 2013

Authors:

Wen De Liu*, Zhen Feng Kang, Qiang Li, Ping Ping Zheng, Tie Zhu Ding

Keywords:

AC Impedance Spectroscopy (ACIS), Electrical Conductivity, Low Temperature Solid Oxide Fuel Cells, PLD, YSZ Thin Film

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