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The Optical Properties and the Structure of CuInS2 Thin Films Deposited by Oblique Angle Deposition Technique

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Abstract:

The oblique angle deposition (OAD) technique was used to deposit copper indium disulfide (CuInS2) films onto glass substrates by a vacuum thermal evaporation method. The powder source used in this work was obtained from the crushed CuInS2 polycrystalline ingot grown by Vertical Bridgeman method. In order to study the influences of depositing angle on the optical property and the structure of the CuInS2 films, the depositing angle θ was varied from 10° to 70° with a 30° gradient. These films were characterized by SEM, XRD and UV-Vis spectrophotometer. The results showed that the optical property and the structure of the films were closely related to the depositing angle θ. When the depositing angle θ increased, the band gap increased and the intensity of (112) characteristic peak of the CuInS2 films decreased.

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Periodical:

Advanced Materials Research (Volumes 875-877)

Pages:

126-129

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.875-877.126

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Online since:

February 2014

Authors:

Xiang Peng, Yue Zhao, Yan Li Ding, Ming Tao Zhou, Jin He Shi, Li Rong Wang, Xiao Yan Liang, Jia Hua Min

Keywords:

CuInS2 Thin Films, Oblique Angle Deposition, Vacuum Thermal Evaporation

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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