Multi-Function Device for Creep Testing at Elevated Temperature

Andrzej Majcher; Bohdan Węglowski; Paweł Ocłoń

doi:10.4028/www.scientific.net/AMR.875-877.462

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 875-877Multi-Function Device for Creep Testing at...

Multi-Function Device for Creep Testing at Elevated Temperature

Abstract:

Searching for quick methods to assess the material usefulness for constructing machine components working at elevated temperatures and variable stresses is accompanied with development of devices facilitating such testing. The paper presents construction of a device, that enables carrying out the standard creep tests (PN-EN ISO 204) and the dedicated tests with the programmed low-cycle loads and the different profiles for temperature and stress changes. The basic parameters of the device are described and the examples of the programmed strength testings are given.

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Periodical:

Advanced Materials Research (Volumes 875-877)

Pages:

462-466

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.875-877.462

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Online since:

February 2014

Authors:

Andrzej Majcher, Bohdan Węglowski, Paweł Ocłoń

Keywords:

Accelerated Creep Testing, Creep Testing Machine, Creeping, Low-Cycle Fatigue

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References

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