Novel Prediction Analysis Method for Error Separation of Stylus System and CMM Machine

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Abstract:

Coordinate Measuring Machine (CMM) is nowadays widely used for a large range of accurate and precise dimensional measurements. The strategy of µ-scale measurement is expected to carry out with ever-increasing performance in term of root error separation for stylus system and CMM machine accuracy. The experimental analysis method in this paper aims to study the effect of dynamic root errors at different undulations per revolution (UPR) response of artifact measurement using selected two types of CMM touch-triggering stylus. Direction of stylus characteristics and stylus speed parameters were adopted and emphasized upon throughout the course of experiment. The results were investigated using Fourier analysis could thus be derived to ensure foreseeable accurate and precise results of CMM machine and stylus errors. Some specific error equations for stylus system and machine responses have been postulated and analysed empirically. The results may also employ validating an experimental investigation to detection accuracy development using PRISMO-Bridge-CMM-type in NIS.

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Advanced Materials Research (Volumes 875-877)

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671-679

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February 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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