Cube Texture Formation of Cu-33at.%Ni Alloy Substrates and CeO2 Buffer Layer for YBCO Coated Conductors

Hui Tian; Hong Li Suo; Ya Ru Liang; Yue Zhao; Lin Ma; Yi Chen Meng; Jean Claude Grivel; Ning Yi

doi:10.4028/www.scientific.net/AMR.887-888.345

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 887-888Cube Texture Formation of Cu-33at.%Ni Alloy...

Cube Texture Formation of Cu-33at.%Ni Alloy Substrates and CeO₂ Buffer Layer for YBCO Coated Conductors

Abstract:

Cube texture formation of Cu-33 at.%Ni alloy substartes and CeO₂ buffer layer prepared by chemical solution deposition on the textured substrate were investigated by electron back scattered diffraction (EBSD) and XRD technics systematically. The results shown that a strong cube textured Cu-33at.%Ni alloy substrate with the cube texture fraction of 99.8 % (< 10°) was obtained after annealing at 1000°C for 1 h. The full width half maximum (FWHM) values for the X-ray (111) phi-scan and (002) omega-scan in this substrate were 7.31° and 5.51°, respectively. Furthermore, the cube texture fraction of epitaxially grown CeO₂ buffer layer was 95 % (< 10°), and the FWHM values of phi-scan and omega-scan being 6.98° and 5.92°, respectively.

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Advanced Materials Research (Volumes 887-888)

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345-348

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.887-888.345

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Online since:

February 2014

Authors:

Hui Tian, Hong Li Suo*, Ya Ru Liang, Yue Zhao, Lin Ma, Yi Chen Meng, Jean Claude Grivel, Ning Yi

Keywords:

CeO₂ Buffer Layer, Cu-33at.%Ni Alloy Substrates, Cube Texture, EBSD, XRD

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