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Morphology and Optical Studies of (1-x)ZnAl2O4 – xSiO2 Thin Films Prepared by Sol-Gel Method

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Abstract:

The effect of morphological structures and optical band gap of (1-x)ZnAl2O4 xSiO2 samples with compositions of x = 0.00, 0.05, 0.10 and 0.15 were prepared by sol-gel method. Spin coating technique was used to deposited the (1-x)ZnAl2O4 xSiO2 as a thin film and to investigate the structural and optical band gap. The produced thin film samples were annealed at 450 °C for 1h. Field emission scanning electron microscope (FESEM) was used to investigate the surface morphology of the samples. The average particle size for (1-x)ZnAl2O4 xSiO2 is about 331.23 nm. The particle size are tend to increase as the composition of SiO2 increased. XRD analysis shows the formation of cubic structure phase and dominant peak has been observed with Miller Indices (311) plane. The average crystallite size, D was calculated with average size about 8 13 nm. The optical band gap was calculated for (1-x)ZnAl2O4 xSiO2 samples and it was found within range of 3.34 to 3.94 eV.

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Periodical:

Advanced Materials Research (Volume 895)

Pages:

63-68

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.895.63

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Online since:

February 2014

Authors:

Mohd Syafiq Zulfakar, Huda Abdullah, Wan Nasarudin Wan Jalal, Sahbudin Shaari, Zainuddin Zalita

Keywords:

Energy Band Gap, Sol-Gel Method, Surface Morphology, Zinc Aluminate

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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