Developments of X-Ray Grating Imaging Technology

Abstract:

The present paper reviews the X-ray grating imaging systems at home and abroad from the aspects of technological characterizations and the newest researching focus. First, not only the imaging principles and the frameworks of the typical X-ray grating imaging system based on Talbot-Lau interferometry method, but also the algorithms of retrieving the signals of attenuation, refraction and small-angle scattering are introduced. Second, the system optimizing methods are discussed, which involves mainly the relaxing the requirement of high positioning resolution and strict circumstances for gratings and designing large field of view with high resolution. Third, two and four-dimensional grating-based X-ray imaging techniques are introduced.

• Periodical: Advanced Materials Research (Volume 898)
• Pages: 614-617
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.898.614
• Online since: February 2014
• Authors: Rui Hong Li*, Yue Ping Han
• Keywords: Grating Imaging, Research and Development (R&D), Talbot Interferometry, X-Ray

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