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The Structural and Surface Morphology of Annealed ZnO Films

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Abstract:

ZnO thin films were deposited on the glass substrates via the sol-gel dip coating method. The films were annealed at various temperatures ranging from 350 °C to 550 °C. X-ray diffraction (XRD), and atomic force microscopy (AFM) were used to investigate the effect of annealing temperature on the structural and morphology properties of the films. The as grown films exhibited amorphous pattern while annealed films were polycrystalline structure with (002) preferential growth along c-axis orientation. The AFM micrographs revealed that the RMS roughness of the films increased as the annealing temperature increased. The grain size was ranging from 32.1 nm to 176.0 nm as the annealing temperature increased from 350 °C to 450 °C and decreased to 56.1 nm for 550 °C.

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Periodical:

Advanced Materials Research (Volume 903)

Pages:

73-77

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.903.73

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Online since:

February 2014

Authors:

Peh Ly Tat*, Karim bin Deraman, Rosli Hussin, Wan Nurulhuda Wan Shamsuri, Zuhairi Ibrahim

Keywords:

Annealing Temperature, Morpholoy, Sol-Gel Dip Coating, Structural, ZnO Thin Films

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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