Compact and Precise Gonio-Stage for Thin Film Measurements by Using Glancing Incident Synchrotron X-Ray

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Abstract:

A Compact and precise gonio-stage for Grazing incidence X-ray absorption fine structure (GIXAFS) measurement is presented in this paper. The gonio-stage can provide a range of 0-35mrad and a resolution of 0.012mrad. An expert alignment can be realized automatically by computer program to obtain precise initial condition. An accuracy verification test of angle control carried out on BL7C station in KEK gives a satisfied result. At last, high quality GIXAFS spectra for 200nm thick HfO2/Si thin film were obtained.

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Advanced Materials Research (Volumes 915-916)

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1082-1085

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April 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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