Effect of Copper Micro-Scale Excess on the Dielectric Properties of CaCu₃Ti₄O₁₂ Ceramics Prepared via Tape Casting

Abstract:

CaCu_{(3+ x)}Ti₄O₁₂ (x = 0, 0.001, 0.002, 0.004 and 0.008) ceramics with variation in copper micro-scale excess were prepared via solid-state reaction, Aqueous technology of tape casting was applied to obtain thick films of, about 100 μm in thickness. Crystal phases of the samples were identified by XRD. SEM of samples revealed that copper micro-scale excess can accelerate some important solid phase reactions in the sintering process, most because of liquid phase sintering mechanism. EDX analysis indicated that copper micro-scale excess could compensate for a lack of copper in sintering process. The Cu_3.004 sample exhibited the best dielectric properties with a very low dielectric loss (0.029), while retaining a very high dielectric constant (91,536), and the Cu_3.002 and Cu_3.004 samples exhibited a well frequency and temperature stability which was of significant industrial relevance. In this work, it was concluded that a certain amount of Cu micro-scale excess could improve dielectric properties, frequency stability and temperature stability of CCTO ceramics.

• Periodical: Advanced Materials Research (Volumes 941-944)
• Pages: 517-520
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.941-944.517
• Online since: June 2014
• Authors: Wei Li*, Zhao Xian Xiong, Hao Xue, Chun Xiao Song, Hong Qiu
• Keywords: Dielectric Property, Grain Boundary, Perovskites, Tape Casting

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