Dielectric Relaxation Measurements in La2Mo1.5W0.5O9 Oxide-Ion Conductor

Dan Li; Jun Li; Chong Chen; Lin Qi; Xiang Hu Li

doi:10.4028/www.scientific.net/AMR.952.51

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 952Dielectric Relaxation Measurements in...

Dielectric Relaxation Measurements in La₂Mo_1.5W_0.5O₉Oxide-Ion Conductor

Abstract:

The effects of tungsten doping in La2Mo1.5W0.5O9 sample were studied using dielectric relaxation measurements. The results indicate that W6+ can suppress the α/β phase transition in the La2Mo2O9. Additional to the low-temperature relaxation peak Pd associated with oxygen ion diffusion, a new dielectric loss peak Ph associated with a phase transition from the static disordered state to the dynamic disordered state of oxygen ion distribution was observed around 740 K.

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Advanced Materials Research (Volume 952)

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51-54

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https://doi.org/10.4028/www.scientific.net/AMR.952.51

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Online since:

May 2014

Authors:

Dan Li*, Jun Li, Chong Chen, Lin Qi, Xiang Hu Li

Keywords:

Dielectric Relaxation, La₂Mo₂O₉, Oxide-Ion Conductor

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