Surface Roughness Pattern Measurement of Tensile Specimen by Using Digital Holography

Article Preview

Abstract:

The objective of this paper is measurement of the surface roughness of tensile specimens under different tensile speed. In the test, the tensile specimens were loaded by tensile testing machine. The roughness of the surfaces was measured by digital holographic interferometric system (DHI). From the results, it was confirmed that DHI could measure the roughness of the various types of the specimen surface. In this paper, as the tensile speed was faster, the roughness of specimen surface was smaller.

You might also be interested in these eBooks

Info:

[1] D. Gabor, A new microscopic principle, Nature. 1611 777-778.

Google Scholar

[2] D. Gabor, Microscopy by reconstructed wavefront, Proc. Roy. Soc. 197, 454-487(1949).

Google Scholar

[3] D. Gabor, Microscopy by reconstructed wavefront II, Proc. Phys. Soc. 64, 449-469(1951).

Google Scholar

[4] J. W. Goodman, and R. W. Lawrence, Digital phase formation from electronically detected holograms, Appl. Phys. Lett. 1, 77-79 (1967).

DOI: 10.1063/1.1755043

Google Scholar

[5] M. A. Kronrod, N. S. Merzlyakov and L. P. Yaroslavskii, Reconstruction of a hologram with a computer, Sov. Phys. Tech. Phys. 17, 333-334 (1972).

Google Scholar

[6] U. Schnars, and W. Juptner, Direct recording of hologram by a CCD target and numerical reconstruction, Appl. Opt. 33, 179-181 (1994).

DOI: 10.1364/ao.33.000179

Google Scholar

[7] B. Javidi, and E. Tajahuerce, Three-dimensional object recognition by use of digital holography, Opt. Lett. 25, 610-612 (2000).

DOI: 10.1364/ol.25.000610

Google Scholar

[8] T. Zhang and I. Yamaguchi, Three-dimensional microscopy with phse shifting digital holography, Opt. Lett. 23, 1221-1223 (1998).

DOI: 10.1364/ol.23.001221

Google Scholar

[9] B. C. Kim and S. W. Kim, Absolute interferometer for three-dimensional profile 45 measurement of rough surfaces, Opt. Lett. 28, 528-530 (2003).

DOI: 10.1364/ol.28.000528

Google Scholar